Abstract
We present the first measurements of the electrical I-V characteristics of AlCuFe quasicrystalline thin films processed by solid state interdiffusion of magnetron sputtered Al, Cu, and Fe layers. Despite the peculiar electronic properties of quasicrystals, our results show that those samples follow perfectly Ohm's law for bias voltages which vary by 7 orders of magnitude.
| Original language | English |
|---|---|
| Pages (from-to) | 2248-2251 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 73 |
| Issue number | 16 |
| DOIs | |
| Publication status | Published - 1 Jan 1994 |
| Externally published | Yes |