Abstract
The quasi-static approach in the dynamic modeling considers that a thin-film transistor (TFT) reaches the steady-state instantaneously, and how to insert its behavior before steady-state is an important issue. In this paper, dynamic responses of silicon-based TFTs under gate-voltage pulse are studied in details. We experimentally distinguish quasi-static and non-quasi-static cases and we identify two charging regimes of the channel formation: channel propagation and charging of the fully propagated channel. We propose a model for the channel propagation, with a compact model-like approach to take into account the effect of defect states.
| Original language | English |
|---|---|
| Article number | 6479318 |
| Pages (from-to) | 871-876 |
| Number of pages | 6 |
| Journal | IEEE/OSA Journal of Display Technology |
| Volume | 9 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 19 Mar 2013 |
Keywords
- Channel formation
- Delay time
- Dynamic measurement
- Intrinsic capacitances
- Non-quasi-static model
- Thin-film transistor (TFT)
- Transient