Effect of depth etching on Bragg reflectors realized by Focused Ion Beam in Ti: LiNbO3 waveguide

K. Ghoumid, R. Ferriere, B. E. Benkelfat, G. Ulliac, R. Salut, J. Y. Rauch, T. Gharbi

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper we have studied effect of depth etching on the Bragg gratings (BGs) realized by Focused Ions Beam. This technique has the advantage to induce a direct waveguide structuring without intermediate media, comparing to traditional methods. A reflectivity of 96% within a window centred at 1550 nm is obtained. The effect of the depth etching on the transmittance and the bandwidth at half maximum is demonstrated.

Original languageEnglish
Title of host publicationPhotonics North 2009
DOIs
Publication statusPublished - 20 Nov 2009
EventPhotonics North 2009 - Laval, QC, Canada
Duration: 24 May 200927 May 2009

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume7386
ISSN (Print)0277-786X

Conference

ConferencePhotonics North 2009
Country/TerritoryCanada
CityLaval, QC
Period24/05/0927/05/09

Keywords

  • Bragg grating
  • Focused ions beam
  • Lithium niobate
  • Transmittance

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