Abstract
We study the effect of Gaussian energetic disorder on the organic field-effect transistors (OFETs) with surprisingly high field-effect mobility and the low contact resistance. The numerical device simulation assumes the thermally assisted hopping transport and injection in disordered semiconductors. The results are analyzed with the power-law field-effect mobility and the asymptotic power-law contact resistance model. Transistor parameters extracted by the models reveal that a higher Gaussian disorder, which leads to a lower injection barrier and a larger mobility enhancement, is the origin of the high field-effect mobility and the low contact resistance.
| Original language | English |
|---|---|
| Article number | 9258937 |
| Pages (from-to) | 307-310 |
| Number of pages | 4 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 68 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 1 Jan 2021 |
| Externally published | Yes |
Keywords
- Contact resistance
- field-effect mobility
- numerical simulation
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