Abstract
Multi-dimensional classification (MDC) is the supervised learning problem where an instance is associated with multiple classes, rather than with a single class, as in traditional classification problems. Since these classes are often strongly correlated, modeling the dependencies between them allows MDC methods to improve their performance - at the expense of an increased computational cost. In this paper we focus on the classifier chains (CC) approach for modeling dependencies, one of the most popular and highest-performing methods for multi-label classification (MLC), a particular case of MDC which involves only binary classes (i.e., labels). The original CC algorithm makes a greedy approximation, and is fast but tends to propagate errors along the chain. Here we present novel Monte Carlo schemes, both for finding a good chain sequence and performing efficient inference. Our algorithms remain tractable for high-dimensional data sets and obtain the best predictive performance across several real data sets.
| Original language | English |
|---|---|
| Pages (from-to) | 1535-1546 |
| Number of pages | 12 |
| Journal | Pattern Recognition |
| Volume | 47 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Mar 2014 |
| Externally published | Yes |
Keywords
- Bayesian inference
- Classifier chains
- Monte Carlo methods
- Multi-dimensional classification
- Multi-label classification
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