Electron spectrometry at the μeV level and the electron affinities of Si and F

C. Blondel; C. Delsart; F. Goldfarb

doi:10.1088/0953-4075/34/9/101

Electron spectrometry at the μeV level and the electron affinities of Si and F

C. Blondel
, C. Delsart
, F. Goldfarb

Centre national de la recherche scientifique

Research output: Contribution to journal › Letter › peer-review

Abstract

Photodetachment microscopy of the negative ions Si^- and F^- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of ²⁸Si and ¹⁹F are 11207.252(18) and 27432.446(19) cm^-1, i.e. 1.389 5220(24) and 3.401 1895(25) eV, respectively.

Original language	English
Pages (from-to)	L281-L288
Journal	Journal of Physics B: Atomic, Molecular and Optical Physics
Volume	34
Issue number	9
DOIs	https://doi.org/10.1088/0953-4075/34/9/101
Publication status	Published - 14 May 2001

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title = "Electron spectrometry at the μeV level and the electron affinities of Si and F",

abstract = "Photodetachment microscopy of the negative ions Si- and F- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of 28Si and 19F are 11207.252(18) and 27432.446(19) cm-1, i.e. 1.389 5220(24) and 3.401 1895(25) eV, respectively.",

author = "C. Blondel and C. Delsart and F. Goldfarb",

year = "2001",

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doi = "10.1088/0953-4075/34/9/101",

language = "English",

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TY - JOUR

T1 - Electron spectrometry at the μeV level and the electron affinities of Si and F

AU - Blondel, C.

AU - Delsart, C.

AU - Goldfarb, F.

PY - 2001/5/14

Y1 - 2001/5/14

N2 - Photodetachment microscopy of the negative ions Si- and F- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of 28Si and 19F are 11207.252(18) and 27432.446(19) cm-1, i.e. 1.389 5220(24) and 3.401 1895(25) eV, respectively.

AB - Photodetachment microscopy of the negative ions Si- and F- has made it possible to measure the electron affinities of silicon and fluorine with improved accuracy. The new recommended electron affinities of 28Si and 19F are 11207.252(18) and 27432.446(19) cm-1, i.e. 1.389 5220(24) and 3.401 1895(25) eV, respectively.

U2 - 10.1088/0953-4075/34/9/101

DO - 10.1088/0953-4075/34/9/101

M3 - Letter

AN - SCOPUS:0035858345

SN - 0953-4075

VL - 34

SP - L281-L288

JO - Journal of Physics B: Atomic, Molecular and Optical Physics

JF - Journal of Physics B: Atomic, Molecular and Optical Physics

IS - 9

ER -

Electron spectrometry at the μeV level and the electron affinities of Si and F

Abstract

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