Electron yield X ray absorption spectroscopy studies of electrochemically prepared Cu/InP interfaces

N. Ollier, A. Etcheberry, J. L. Sculfort, J. Vigneron, A. Marbeuf, G. Tourillon

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	198-199
Number of pages	2
Journal	Physica B: Physics of Condensed Matter
Volume	158
Issue number	1-3
DOIs	https://doi.org/10.1016/0921-4526(89)90252-4
Publication status	Published - 1 Jan 1989
Externally published	Yes

Access to Document

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title = "Electron yield X ray absorption spectroscopy studies of electrochemically prepared Cu/InP interfaces",

author = "N. Ollier and A. Etcheberry and Sculfort, \{J. L.\} and J. Vigneron and A. Marbeuf and G. Tourillon",

year = "1989",

month = jan,

day = "1",

doi = "10.1016/0921-4526(89)90252-4",

language = "English",

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pages = "198--199",

journal = "Physica B: Physics of Condensed Matter",

issn = "0921-4526",

number = "1-3",

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TY - JOUR

T1 - Electron yield X ray absorption spectroscopy studies of electrochemically prepared Cu/InP interfaces

AU - Ollier, N.

AU - Etcheberry, A.

AU - Sculfort, J. L.

AU - Vigneron, J.

AU - Marbeuf, A.

AU - Tourillon, G.

PY - 1989/1/1

Y1 - 1989/1/1

U2 - 10.1016/0921-4526(89)90252-4

DO - 10.1016/0921-4526(89)90252-4

M3 - Article

AN - SCOPUS:0024681536

SN - 0921-4526

VL - 158

SP - 198

EP - 199

JO - Physica B: Physics of Condensed Matter

JF - Physica B: Physics of Condensed Matter

IS - 1-3

ER -