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Ene-like reaction of cyclopentene on Si(001)-2 × 1: An XPS and NEXAFS study

  • Anzar Khaliq
  • , Debora Pierucci
  • , Héloïse Tissot
  • , Jean Jacques Gallet
  • , Fabrice Bournel
  • , François Rochet
  • , Mathieu Silly
  • , Fausto Sirotti
  • Universie Pierre et Marie Curie - CNRS UMR 7614
  • Synchrotron SOLEIL

Research output: Contribution to journalArticlepeer-review

Abstract

The control and the understanding of single-molecule covalent coatings on silicon surfaces is increasingly important in designing nanoscale electrical elements, such as organic/inorganic semiconductor hybrid structures. In this respect, ordered arrays of cyclopentene deposited on Si(001)-2 × 1 appear as promising buffer layers for further molecular crystal growth on the substrate. In this work, we examine the adsorption of cyclopentene on Si(001)-2 × 1 at 130 and 280 °C by means of C 1s XPS and NEXAFS. Until now cryogenic and room-temperature adsorption studies tended to prove that cyclopentene adsorption results from a formal cycloaddition ([2 + 2]-like) reaction of the C→C double bond with a silicon dimer. Our XPS/NEXAFS study reveals that an ene-like reaction competes with the [2 + 2]-like reaction channel, leading to the formation of products bearing a C→C bond, already at deposition temperature as low as ∼130 °C. This work helps to determine the optimum conditions leading to optimal chemical order in view of applications of cyclopentene as a buffer layer.

Original languageEnglish
Pages (from-to)12680-12686
Number of pages7
JournalJournal of Physical Chemistry C
Volume116
Issue number23
DOIs
Publication statusPublished - 14 Jun 2012
Externally publishedYes

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