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Fast plane detection in disparity maps

  • E. Bughin
  • , A. Almansa
  • , R. Grompone Von Gioi
  • , Y. Tendero
  • ENS Paris-Saclay

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Citations (Scopus)

Abstract

We propose a new method for fast detection of planar patches in disparity maps. We first use a region growing algorithm on random seeds. This approach is similar to the one introduced in [1] for fast line segment detection in images. Then, the parameter-free criterion introduced in [2] is used to keep only the patches that are planar. The main advantage of our method is to be able to estimate the disparity map precision which is usually a critical parameter in other methods. This method is specially well suited to 3D reconstruction of urban environments from low-baseline aerial or satellite stereo pairs where a piecewise-planar model can be applied.

Original languageEnglish
Title of host publication2010 IEEE International Conference on Image Processing, ICIP 2010 - Proceedings
Pages2961-2964
Number of pages4
DOIs
Publication statusPublished - 1 Dec 2010
Event2010 17th IEEE International Conference on Image Processing, ICIP 2010 - Hong Kong, Hong Kong
Duration: 26 Sept 201029 Sept 2010

Publication series

NameProceedings - International Conference on Image Processing, ICIP
ISSN (Print)1522-4880

Conference

Conference2010 17th IEEE International Conference on Image Processing, ICIP 2010
Country/TerritoryHong Kong
CityHong Kong
Period26/09/1029/09/10

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