Femtosecond solid-liquid phase transition studied with ultrafast x-ray diffraction

Sylvain Fourmaux; Antoine Rousse; Christian Rischel; Ingo Uschmann; Stéphane Sebban; Philippe Balcou; George Grillon; Eckhart Förster; Jean Claude Gauthier; Danièle Hulin

doi:10.1117/12.448474

Femtosecond solid-liquid phase transition studied with ultrafast x-ray diffraction

Sylvain Fourmaux
, Antoine Rousse
, Christian Rischel
, Ingo Uschmann
, Stéphane Sebban
, Philippe Balcou
, George Grillon
, Eckhart Förster
, Jean Claude Gauthier
, Danièle Hulin

Laboratory d'Optique Appliquée, ENSTA, CNRS-École Polytechnique
Niels Bohr Institutet
Institute of Optics and Quantum Electronics
Friedrich-Schiller University
LULI

Research output: Contribution to journal › Article › peer-review

Abstract

The femtosecond solid-liquid phase transition was studied with ultrafast X-ray diffraction. The ultrafast solid-liquid transition of InSb and CdTe semiconductors was characterized by time resolved x-ray diffraction in the femtosecond timescale. Visible spectroscopic data were obtained together with x-ray measurements to characterize the dense electron-hole plasma at the origin of the phase transition.

Original language	English
Pages (from-to)	26-33
Number of pages	8
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	4504
DOIs	https://doi.org/10.1117/12.448474
Publication status	Published - 1 Jan 2001

Keywords

Femtosecond
InSb
Laser-produced plasma
Melting
Phase transition
Semiconductor
Ultrafast
X-ray
X-ray diffraction

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10.1117/12.448474

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title = "Femtosecond solid-liquid phase transition studied with ultrafast x-ray diffraction",

abstract = "The femtosecond solid-liquid phase transition was studied with ultrafast X-ray diffraction. The ultrafast solid-liquid transition of InSb and CdTe semiconductors was characterized by time resolved x-ray diffraction in the femtosecond timescale. Visible spectroscopic data were obtained together with x-ray measurements to characterize the dense electron-hole plasma at the origin of the phase transition.",

keywords = "Femtosecond, InSb, Laser-produced plasma, Melting, Phase transition, Semiconductor, Ultrafast, X-ray, X-ray diffraction",

author = "Sylvain Fourmaux and Antoine Rousse and Christian Rischel and Ingo Uschmann and St{\'e}phane Sebban and Philippe Balcou and George Grillon and Eckhart F{\"o}rster and Gauthier, \{Jean Claude\} and Dani{\`e}le Hulin",

year = "2001",

month = jan,

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doi = "10.1117/12.448474",

language = "English",

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pages = "26--33",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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TY - JOUR

T1 - Femtosecond solid-liquid phase transition studied with ultrafast x-ray diffraction

AU - Fourmaux, Sylvain

AU - Rousse, Antoine

AU - Rischel, Christian

AU - Uschmann, Ingo

AU - Sebban, Stéphane

AU - Balcou, Philippe

AU - Grillon, George

AU - Förster, Eckhart

AU - Gauthier, Jean Claude

AU - Hulin, Danièle

PY - 2001/1/1

Y1 - 2001/1/1

N2 - The femtosecond solid-liquid phase transition was studied with ultrafast X-ray diffraction. The ultrafast solid-liquid transition of InSb and CdTe semiconductors was characterized by time resolved x-ray diffraction in the femtosecond timescale. Visible spectroscopic data were obtained together with x-ray measurements to characterize the dense electron-hole plasma at the origin of the phase transition.

AB - The femtosecond solid-liquid phase transition was studied with ultrafast X-ray diffraction. The ultrafast solid-liquid transition of InSb and CdTe semiconductors was characterized by time resolved x-ray diffraction in the femtosecond timescale. Visible spectroscopic data were obtained together with x-ray measurements to characterize the dense electron-hole plasma at the origin of the phase transition.

KW - Femtosecond

KW - InSb

KW - Laser-produced plasma

KW - Melting

KW - Phase transition

KW - Semiconductor

KW - Ultrafast

KW - X-ray

KW - X-ray diffraction

U2 - 10.1117/12.448474

DO - 10.1117/12.448474

M3 - Article

AN - SCOPUS:18644365700

SN - 0277-786X

VL - 4504

SP - 26

EP - 33

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

ER -

Femtosecond solid-liquid phase transition studied with ultrafast x-ray diffraction

Abstract

Keywords

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