Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids

Vasily V. Temnov; K. Sokolowski-Tinten; P. Zhou; D. Von Der Linde

doi:10.1109/CLEO.2007.4453315

Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids

Vasily V. Temnov
, K. Sokolowski-Tinten
, P. Zhou
, D. Von Der Linde

University of Dortmund
University of Duisburg-Essen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.

Original language	English
Title of host publication	Conference on Lasers and Electro-Optics, 2007, CLEO 2007
DOIs	https://doi.org/10.1109/CLEO.2007.4453315
Publication status	Published - 1 Dec 2007
Externally published	Yes
Event	Conference on Lasers and Electro-Optics, 2007, CLEO 2007 - Baltimore, MD, United States Duration: 6 May 2007 → 11 May 2007

Publication series

Name	Conference on Lasers and Electro-Optics, 2007, CLEO 2007

Conference

Conference	Conference on Lasers and Electro-Optics, 2007, CLEO 2007
Country/Territory	United States
City	Baltimore, MD
Period	6/05/07 → 11/05/07

Access to Document

10.1109/CLEO.2007.4453315

Cite this

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title = "Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids",

abstract = "Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.",

author = "Temnov, \{Vasily V.\} and K. Sokolowski-Tinten and P. Zhou and \{Von Der Linde\}, D.",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/CLEO.2007.4453315",

language = "English",

isbn = "9781557528346",

series = "Conference on Lasers and Electro-Optics, 2007, CLEO 2007",

booktitle = "Conference on Lasers and Electro-Optics, 2007, CLEO 2007",

note = "Conference on Lasers and Electro-Optics, 2007, CLEO 2007 ; Conference date: 06-05-2007 Through 11-05-2007",

}

Temnov, VV, Sokolowski-Tinten, K, Zhou, P & Von Der Linde, D 2007, Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids. in Conference on Lasers and Electro-Optics, 2007, CLEO 2007., 4453315, Conference on Lasers and Electro-Optics, 2007, CLEO 2007, Conference on Lasers and Electro-Optics, 2007, CLEO 2007, Baltimore, MD, United States, 6/05/07. https://doi.org/10.1109/CLEO.2007.4453315

Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids. / Temnov, Vasily V.; Sokolowski-Tinten, K.; Zhou, P. et al.
Conference on Lasers and Electro-Optics, 2007, CLEO 2007. 2007. 4453315 (Conference on Lasers and Electro-Optics, 2007, CLEO 2007).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Femtosecond time-resolved imaging interferometry

T2 - Conference on Lasers and Electro-Optics, 2007, CLEO 2007

AU - Temnov, Vasily V.

AU - Sokolowski-Tinten, K.

AU - Zhou, P.

AU - Von Der Linde, D.

PY - 2007/12/1

Y1 - 2007/12/1

N2 - Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.

AB - Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.

UR - https://www.scopus.com/pages/publications/82955208572

U2 - 10.1109/CLEO.2007.4453315

DO - 10.1109/CLEO.2007.4453315

M3 - Conference contribution

AN - SCOPUS:82955208572

SN - 9781557528346

T3 - Conference on Lasers and Electro-Optics, 2007, CLEO 2007

BT - Conference on Lasers and Electro-Optics, 2007, CLEO 2007

Y2 - 6 May 2007 through 11 May 2007

ER -

Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids

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