Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids

Vasily V. Temnov; K. Sokolowski-Tinten; P. Zhou; D. Von Der Linde

doi:10.1109/QELS.2007.4431092

Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids

Vasily V. Temnov
, K. Sokolowski-Tinten
, P. Zhou
, D. Von Der Linde

University of Dortmund
University of Duisburg-Essen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.

Original language	English
Title of host publication	2007 Quantum Electronics and Laser Science Conference, QELS
DOIs	https://doi.org/10.1109/QELS.2007.4431092
Publication status	Published - 1 Dec 2007
Externally published	Yes
Event	2007 Quantum Electronics and Laser Science Conference, QELS - Baltimore, MD, United States Duration: 6 May 2007 → 11 May 2007

Publication series

Name	Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series

Conference

Conference	2007 Quantum Electronics and Laser Science Conference, QELS
Country/Territory	United States
City	Baltimore, MD
Period	6/05/07 → 11/05/07

Access to Document

10.1109/QELS.2007.4431092

Cite this

Temnov, V. V., Sokolowski-Tinten, K., Zhou, P., & Von Der Linde, D. (2007). Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids. In 2007 Quantum Electronics and Laser Science Conference, QELS Article 4431092 (Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series). https://doi.org/10.1109/QELS.2007.4431092

@inproceedings{d1280de808c14f388451b193c26a3b5e,

title = "Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids",

abstract = "Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.",

author = "Temnov, \{Vasily V.\} and K. Sokolowski-Tinten and P. Zhou and \{Von Der Linde\}, D.",

year = "2007",

month = dec,

day = "1",

doi = "10.1109/QELS.2007.4431092",

language = "English",

isbn = "1557528349",

series = "Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series",

booktitle = "2007 Quantum Electronics and Laser Science Conference, QELS",

note = "2007 Quantum Electronics and Laser Science Conference, QELS ; Conference date: 06-05-2007 Through 11-05-2007",

}

Temnov, VV, Sokolowski-Tinten, K, Zhou, P & Von Der Linde, D 2007, Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids. in 2007 Quantum Electronics and Laser Science Conference, QELS., 4431092, Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series, 2007 Quantum Electronics and Laser Science Conference, QELS, Baltimore, MD, United States, 6/05/07. https://doi.org/10.1109/QELS.2007.4431092

Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids. / Temnov, Vasily V.; Sokolowski-Tinten, K.; Zhou, P. et al.
2007 Quantum Electronics and Laser Science Conference, QELS. 2007. 4431092 (Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Femtosecond time-resolved imaging interferometry

T2 - 2007 Quantum Electronics and Laser Science Conference, QELS

AU - Temnov, Vasily V.

AU - Sokolowski-Tinten, K.

AU - Zhou, P.

AU - Von Der Linde, D.

PY - 2007/12/1

Y1 - 2007/12/1

N2 - Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.

AB - Capabilities of time-resolved interferometry to study ultrafast phenomena in solids are explored by measuring nanometer-scale transient deformations on laser-excited surfaces and ultrafast evolution of small refractive index changes in the bulk of dielectrics.

UR - https://www.scopus.com/pages/publications/51549102266

U2 - 10.1109/QELS.2007.4431092

DO - 10.1109/QELS.2007.4431092

M3 - Conference contribution

AN - SCOPUS:51549102266

SN - 1557528349

SN - 9781557528346

T3 - Conference on Quantum Electronics and Laser Science (QELS) - Technical Digest Series

BT - 2007 Quantum Electronics and Laser Science Conference, QELS

Y2 - 6 May 2007 through 11 May 2007

ER -

Femtosecond time-resolved imaging interferometry: A technique to investigate ultrafast phenomena in solids

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