Femtosecond time-resolved interferometric microscopy

V. V. Temnov; K. Sokolowski-Tinten; P. Zhou; D. Von der Linde

doi:10.1007/s00339-003-2408-x

Femtosecond time-resolved interferometric microscopy

V. V. Temnov
, K. Sokolowski-Tinten
, P. Zhou
, D. Von der Linde

University of Duisburg-Essen
Institute of Applied Physics of the Russian Academy of Sciences

Research output: Contribution to journal › Article › peer-review

Abstract

We describe optical interferometry with 100 fs time resolution and a spatial resolution of approximately one micrometer. Using a pump-probe scheme and a 2D-Fourier transformation algorithm, we are able to retrieve from the interferograms very small changes in the phase and the amplitude of the reflected probe pulses. The performance of the technique is illustrated by measurements of transient and permanent surface modifications of crystalline GaAs after exposure to intense femtosecond laser pulses with fluences near the ablation threshold.

Original language	English
Pages (from-to)	483-489
Number of pages	7
Journal	Applied Physics A: Materials Science and Processing
Volume	78
Issue number	4
DOIs	https://doi.org/10.1007/s00339-003-2408-x
Publication status	Published - 1 Mar 2004
Externally published	Yes

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title = "Femtosecond time-resolved interferometric microscopy",

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AB - We describe optical interferometry with 100 fs time resolution and a spatial resolution of approximately one micrometer. Using a pump-probe scheme and a 2D-Fourier transformation algorithm, we are able to retrieve from the interferograms very small changes in the phase and the amplitude of the reflected probe pulses. The performance of the technique is illustrated by measurements of transient and permanent surface modifications of crystalline GaAs after exposure to intense femtosecond laser pulses with fluences near the ablation threshold.

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Femtosecond time-resolved interferometric microscopy

Abstract

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