From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling

Loic Denis; Charles Alban Deledalle; Florence Tupin

doi:10.1109/IGARSS.2019.8898473

From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling

Loic Denis, Charles Alban Deledalle, Florence Tupin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Speckle reduction has benefited from the recent progress in image processing, in particular patch-based non-local filtering and deep learning techniques. These two families of methods offer complementary characteristics but have not yet been combined. We explore strategies to make the most of each approach.

Original language	English
Title of host publication	2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	5113-5116
Number of pages	4
ISBN (Electronic)	9781538691540
DOIs	https://doi.org/10.1109/IGARSS.2019.8898473
Publication status	Published - 1 Jul 2019
Externally published	Yes
Event	39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Yokohama, Japan Duration: 28 Jul 2019 → 2 Aug 2019

Publication series

Name	International Geoscience and Remote Sensing Symposium (IGARSS)

Conference

Conference	39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019
Country/Territory	Japan
City	Yokohama
Period	28/07/19 → 2/08/19

Keywords

PolSAR
SAR
deep learning
non-local filtering
patches
speckle

Access to Document

10.1109/IGARSS.2019.8898473

Cite this

Denis, L., Deledalle, C. A., & Tupin, F. (2019). From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling. In 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings (pp. 5113-5116). Article 8898473 (International Geoscience and Remote Sensing Symposium (IGARSS)). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IGARSS.2019.8898473

Denis, Loic ; Deledalle, Charles Alban ; Tupin, Florence. / From Patches to Deep Learning : Combining Self-Similarity and Neural Networks for Sar Image Despeckling. 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 5113-5116 (International Geoscience and Remote Sensing Symposium (IGARSS)).

@inproceedings{0b3aaeec111748b886eb746a923c86e9,

title = "From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling",

abstract = "Speckle reduction has benefited from the recent progress in image processing, in particular patch-based non-local filtering and deep learning techniques. These two families of methods offer complementary characteristics but have not yet been combined. We explore strategies to make the most of each approach.",

keywords = "PolSAR, SAR, deep learning, non-local filtering, patches, speckle",

author = "Loic Denis and Deledalle, \{Charles Alban\} and Florence Tupin",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 ; Conference date: 28-07-2019 Through 02-08-2019",

year = "2019",

month = jul,

day = "1",

doi = "10.1109/IGARSS.2019.8898473",

language = "English",

series = "International Geoscience and Remote Sensing Symposium (IGARSS)",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "5113--5116",

booktitle = "2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings",

}

Denis, L, Deledalle, CA & Tupin, F 2019, From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling. in 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings., 8898473, International Geoscience and Remote Sensing Symposium (IGARSS), Institute of Electrical and Electronics Engineers Inc., pp. 5113-5116, 39th IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019, Yokohama, Japan, 28/07/19. https://doi.org/10.1109/IGARSS.2019.8898473

From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling. / Denis, Loic; Deledalle, Charles Alban; Tupin, Florence.
2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 2019. p. 5113-5116 8898473 (International Geoscience and Remote Sensing Symposium (IGARSS)).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Denis, Loic

AU - Deledalle, Charles Alban

AU - Tupin, Florence

PY - 2019/7/1

Y1 - 2019/7/1

N2 - Speckle reduction has benefited from the recent progress in image processing, in particular patch-based non-local filtering and deep learning techniques. These two families of methods offer complementary characteristics but have not yet been combined. We explore strategies to make the most of each approach.

AB - Speckle reduction has benefited from the recent progress in image processing, in particular patch-based non-local filtering and deep learning techniques. These two families of methods offer complementary characteristics but have not yet been combined. We explore strategies to make the most of each approach.

KW - PolSAR

KW - SAR

KW - deep learning

KW - non-local filtering

KW - patches

KW - speckle

U2 - 10.1109/IGARSS.2019.8898473

DO - 10.1109/IGARSS.2019.8898473

M3 - Conference contribution

AN - SCOPUS:85077699475

T3 - International Geoscience and Remote Sensing Symposium (IGARSS)

SP - 5113

EP - 5116

BT - 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 28 July 2019 through 2 August 2019

ER -

Denis L, Deledalle CA, Tupin F. From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling. In 2019 IEEE International Geoscience and Remote Sensing Symposium, IGARSS 2019 - Proceedings. Institute of Electrical and Electronics Engineers Inc. 2019. p. 5113-5116. 8898473. (International Geoscience and Remote Sensing Symposium (IGARSS)). doi: 10.1109/IGARSS.2019.8898473

From Patches to Deep Learning: Combining Self-Similarity and Neural Networks for Sar Image Despeckling

Abstract

Publication series

Conference

Keywords

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