Gamma mixture modeled with "second kind statistics": Application to SAR image processing

J. M. Nicolas; F. Tupin

Gamma mixture modeled with "second kind statistics": Application to SAR image processing

J. M. Nicolas
, F. Tupin

Telecom Paris

Research output: Contribution to conference › Paper › peer-review

Abstract

SAR images are classically analyzed with the help of Goodman approach and multiplicative noise. By this way, speckle is modeled by a Gamma law (for intensity images). A new approach based on "second kind statistics" [1] identifies multiplicative noise as a "Mellin convolution" [2] yielding oversimple expression when texture is not homogeneous. In this article, we propose to use this new approach for solving the problem of binary additive mixture of Gamma law[3] and to apply the results to SAR image processing.

Original language	English
Pages	2489-2491
Number of pages	3
Publication status	Published - 1 Jan 2002
Event	2002 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2002) - Toronto, Ont., Canada Duration: 24 Jun 2002 → 28 Jun 2002

Conference

Conference	2002 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2002)
Country/Territory	Canada
City	Toronto, Ont.
Period	24/06/02 → 28/06/02

Cite this

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title = "Gamma mixture modeled with {"}second kind statistics{"}: Application to SAR image processing",

abstract = "SAR images are classically analyzed with the help of Goodman approach and multiplicative noise. By this way, speckle is modeled by a Gamma law (for intensity images). A new approach based on {"}second kind statistics{"} [1] identifies multiplicative noise as a {"}Mellin convolution{"} [2] yielding oversimple expression when texture is not homogeneous. In this article, we propose to use this new approach for solving the problem of binary additive mixture of Gamma law[3] and to apply the results to SAR image processing.",

author = "Nicolas, \{J. M.\} and F. Tupin",

year = "2002",

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language = "English",

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T2 - 2002 IEEE International Geoscience and Remote Sensing Symposium (IGARSS 2002)

AU - Nicolas, J. M.

AU - Tupin, F.

PY - 2002/1/1

Y1 - 2002/1/1

N2 - SAR images are classically analyzed with the help of Goodman approach and multiplicative noise. By this way, speckle is modeled by a Gamma law (for intensity images). A new approach based on "second kind statistics" [1] identifies multiplicative noise as a "Mellin convolution" [2] yielding oversimple expression when texture is not homogeneous. In this article, we propose to use this new approach for solving the problem of binary additive mixture of Gamma law[3] and to apply the results to SAR image processing.

AB - SAR images are classically analyzed with the help of Goodman approach and multiplicative noise. By this way, speckle is modeled by a Gamma law (for intensity images). A new approach based on "second kind statistics" [1] identifies multiplicative noise as a "Mellin convolution" [2] yielding oversimple expression when texture is not homogeneous. In this article, we propose to use this new approach for solving the problem of binary additive mixture of Gamma law[3] and to apply the results to SAR image processing.

M3 - Paper

AN - SCOPUS:0036400470

SP - 2489

EP - 2491

Y2 - 24 June 2002 through 28 June 2002

ER -

Gamma mixture modeled with "second kind statistics": Application to SAR image processing

Abstract

Conference

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