TY - GEN
T1 - Generic and Effective Specification of Structural Test Objectives
AU - Marcozzi, Michael
AU - Delahaye, Mickael
AU - Bardin, Sebastien
AU - Kosmatov, Nikolai
AU - Prevosto, Virgile
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/5/15
Y1 - 2017/5/15
N2 - A large amount of research has been carried out to automate white-box testing. While a wide range of different and sometimes heterogeneous code-coverage criteria have been proposed, there exists no generic formalism to describe them all, and available test automation tools usually support only a small subset of them. We introduce a new specification language, called HTOL (Hyperlabel Test Objectives Language), providing a powerful generic mechanism to define a wide range of test objectives. HTOL comes with a formal semantics, and can encode all standard criteria but full mutations. Besides specification, HTOL is appealing in the context of test automation as it allows handling criteria in a unified way.
AB - A large amount of research has been carried out to automate white-box testing. While a wide range of different and sometimes heterogeneous code-coverage criteria have been proposed, there exists no generic formalism to describe them all, and available test automation tools usually support only a small subset of them. We introduce a new specification language, called HTOL (Hyperlabel Test Objectives Language), providing a powerful generic mechanism to define a wide range of test objectives. HTOL comes with a formal semantics, and can encode all standard criteria but full mutations. Besides specification, HTOL is appealing in the context of test automation as it allows handling criteria in a unified way.
KW - Coverage Criteria
KW - MCDC
KW - Test Objective Specification Language
KW - White-Box Testing
UR - https://www.scopus.com/pages/publications/85020725622
U2 - 10.1109/ICST.2017.48
DO - 10.1109/ICST.2017.48
M3 - Conference contribution
AN - SCOPUS:85020725622
T3 - Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017
SP - 436
EP - 441
BT - Proceedings - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 10th IEEE International Conference on Software Testing, Verification and Validation, ICST 2017
Y2 - 13 March 2017 through 17 March 2017
ER -