Abstract
A study was made of the structure relaxation at the abrupt (110) Ge/GaAs interface by applying quantum chemical methods to clusters modeling this interface. Application of this model to bulk Ge and to bulk GaAs leads to theoretical Ge-Ge and Ga-As bond distances of 2. 452 and 2. 451 A, respectively, in good agreement with the experimental values of 2. 450 and 2. 448 A, respectively. Application of the model Ge/GaAs (110) interface indicates that this interface is nearly ideal. The authors find a very slight reconstruction at the interface leading to a Ge-Ga bond distance which is 0. 04 A longer than the Ge-As bond distance of 2. 430 Angstrom. The calculated spacing of the interface layer is 2. 3% greater than that of bulk Ge or bulk GaAs.
| Original language | English |
|---|---|
| Pages (from-to) | 551-555 |
| Number of pages | 5 |
| Journal | J Vac Sci Technol |
| Volume | 19 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Jan 1981 |
| Externally published | Yes |
| Event | Proc of the Annu Conf on the Phys of Compd Semicond Interfaces, 8th - Williamsburg, VA, USA Duration: 27 Jan 1981 → 29 Jan 1981 |
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