Ge/SrTiO 3(001) interface probed by soft x-ray synchrotron-radiation time-resolved photoemission

M. El Kazzi; B. Gobaut; J. Penuelas; G. Grenet; M. G. Silly; F. Sirotti; G. Saint-Girons

doi:10.1103/PhysRevB.85.075317

Ge/SrTiO ₃(001) interface probed by soft x-ray synchrotron-radiation time-resolved photoemission

M. El Kazzi, B. Gobaut, J. Penuelas, G. Grenet, M. G. Silly, F. Sirotti, G. Saint-Girons

Research output: Contribution to journal › Article › peer-review

Abstract

Soft x-ray synchrotron-radiation photoemission has been used to study the interface between Ge and SrTiO ₃(100). Mapping as annealing temperature varies reveals that Ge adsorption is strongly dependent on the SrTiO ₃ surface's initial composition: the richer the surface is in TiO _x, the more Ge wets the STO surface. Time-resolved photoemission has enabled us to monitor Ge bonding and desorption as a function of annealing temperature. As temperature increases, the Ge2 ⁺, Ge ⁺, and Ge0 component evolution reveals that Ge adatoms, initially bonded to two (or more) oxygen atoms gradually aggregate to form Ge clusters. Finally, the bonding is via a single oxygen atom, suggesting (111)-oriented clusters.

Original language	English
Article number	075317
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	85
Issue number	7
DOIs	https://doi.org/10.1103/PhysRevB.85.075317
Publication status	Published - 22 Feb 2012
Externally published	Yes

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10.1103/PhysRevB.85.075317

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title = "Ge/SrTiO 3(001) interface probed by soft x-ray synchrotron-radiation time-resolved photoemission",

abstract = "Soft x-ray synchrotron-radiation photoemission has been used to study the interface between Ge and SrTiO 3(100). Mapping as annealing temperature varies reveals that Ge adsorption is strongly dependent on the SrTiO 3 surface's initial composition: the richer the surface is in TiO x, the more Ge wets the STO surface. Time-resolved photoemission has enabled us to monitor Ge bonding and desorption as a function of annealing temperature. As temperature increases, the Ge2 +, Ge +, and Ge0 component evolution reveals that Ge adatoms, initially bonded to two (or more) oxygen atoms gradually aggregate to form Ge clusters. Finally, the bonding is via a single oxygen atom, suggesting (111)-oriented clusters.",

author = "\{El Kazzi\}, M. and B. Gobaut and J. Penuelas and G. Grenet and Silly, \{M. G.\} and F. Sirotti and G. Saint-Girons",

year = "2012",

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doi = "10.1103/PhysRevB.85.075317",

language = "English",

volume = "85",

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T1 - Ge/SrTiO 3(001) interface probed by soft x-ray synchrotron-radiation time-resolved photoemission

AU - El Kazzi, M.

AU - Gobaut, B.

AU - Penuelas, J.

AU - Grenet, G.

AU - Silly, M. G.

AU - Sirotti, F.

AU - Saint-Girons, G.

PY - 2012/2/22

Y1 - 2012/2/22

N2 - Soft x-ray synchrotron-radiation photoemission has been used to study the interface between Ge and SrTiO 3(100). Mapping as annealing temperature varies reveals that Ge adsorption is strongly dependent on the SrTiO 3 surface's initial composition: the richer the surface is in TiO x, the more Ge wets the STO surface. Time-resolved photoemission has enabled us to monitor Ge bonding and desorption as a function of annealing temperature. As temperature increases, the Ge2 +, Ge +, and Ge0 component evolution reveals that Ge adatoms, initially bonded to two (or more) oxygen atoms gradually aggregate to form Ge clusters. Finally, the bonding is via a single oxygen atom, suggesting (111)-oriented clusters.

AB - Soft x-ray synchrotron-radiation photoemission has been used to study the interface between Ge and SrTiO 3(100). Mapping as annealing temperature varies reveals that Ge adsorption is strongly dependent on the SrTiO 3 surface's initial composition: the richer the surface is in TiO x, the more Ge wets the STO surface. Time-resolved photoemission has enabled us to monitor Ge bonding and desorption as a function of annealing temperature. As temperature increases, the Ge2 +, Ge +, and Ge0 component evolution reveals that Ge adatoms, initially bonded to two (or more) oxygen atoms gradually aggregate to form Ge clusters. Finally, the bonding is via a single oxygen atom, suggesting (111)-oriented clusters.

U2 - 10.1103/PhysRevB.85.075317

DO - 10.1103/PhysRevB.85.075317

M3 - Article

AN - SCOPUS:84857724596

SN - 1098-0121

VL - 85

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 7

M1 - 075317

ER -

Ge/SrTiO 3(001) interface probed by soft x-ray synchrotron-radiation time-resolved photoemission

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Ge/SrTiO ₃(001) interface probed by soft x-ray synchrotron-radiation time-resolved photoemission