Abstract
Using the dielectric resonator method, we have investigated nonlinearities in the surface impedance Zs Rs + jXs of YBa2Cu3O7-δ thin films at 10 GHz as a function of the incident microwave power level and temperature. The use of a rutile dielectric resonator allows us to measure the precise temperature of the films. We conclusively show that the usually observed increase of the surface resistance of YBa2Cu3O7-δ thin film as function of microwave power is due to local heating.
| Original language | English |
|---|---|
| Article number | 052107 |
| Journal | Journal of Physics: Conference Series |
| Volume | 150 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - 1 Jan 2009 |
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