Abstract
The heteroepitaxy of InAs on a Te covered GaAs surface is investigated by photoelectron spectroscopy. Core-level spectra probed with synchrotron radiation show that Te remains at the interface between InAs and GaAs in a concentration much higher than the solubility limit of this element in III-V compounds, suggesting that a new compound is being formed. We propose that this interlayer is responsible for the observed changing in the growth mode of the InAs overlayer from islands to layer by layer.
| Original language | English |
|---|---|
| Pages (from-to) | 873-877 |
| Number of pages | 5 |
| Journal | Solid State Communications |
| Volume | 95 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published - 1 Jan 1995 |
| Externally published | Yes |
Keywords
- A. semiconductors
- A. surfaces and interfaces
- B. epitaxy
- E. photoelectron spectroscopies
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