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Heteroepitaxial Writing of Silicon-on-Sapphire Nanowires

  • Mingkun Xu
  • , Zhaoguo Xue
  • , Jimmy Wang
  • , Yaolong Zhao
  • , Yao Duan
  • , Guangyao Zhu
  • , Linwei Yu
  • , Jun Xu
  • , Junzhuan Wang
  • , Yi Shi
  • , Kunji Chen
  • , Pere RocaCabarrocas

Research output: Contribution to journalArticlepeer-review

Abstract

The heteroepitaxial growth of crystal silicon thin films on sapphire, usually referred to as SoS, has been a key technology for high-speed mixed-signal integrated circuits and processors. Here, we report a novel nanoscale SoS heteroepitaxial growth that resembles the in-plane writing of self-aligned silicon nanowires (SiNWs) on R-plane sapphire. During a low-temperature growth at <350 °C, compared to that required for conventional SoS fabrication at >900 °C, the bottom heterointerface cultivates crystalline Si pyramid seeds within the catalyst droplet, while the vertical SiNW/catalyst interface subsequently threads the seeds into continuous nanowires, producing self-oriented in-plane SiNWs that follow a set of crystallographic directions of the sapphire substrate. Despite the low-temperature fabrication process, the field effect transistors built on the SoS-SiNWs demonstrate a high on/off ratio of >5 × 104 and a peak hole mobility of >50 cm2/V·s. These results indicate the novel potential of deploying in-plane SoS nanowire channels in places that require high-performance nanoelectronics and optoelectronics with a drastically reduced thermal budget and a simplified manufacturing procedure.

Original languageEnglish
Pages (from-to)7317-7324
Number of pages8
JournalNano Letters
Volume16
Issue number12
DOIs
Publication statusPublished - 14 Dec 2016
Externally publishedYes

Keywords

  • In-plane Si nanowires
  • heteroepitaxy
  • self-alignment
  • silicon on sapphire

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