Skip to main navigation Skip to search Skip to main content

HIDEX: A new high resolution x-ray spectrometer for detailed line profile measurements

  • E. Galtier
  • , O. Renner
  • , E. Krouský
  • , F. Rosmej
  • Stanford Linear Accelerator Center
  • Institute of Physics of the Czech Academy of Sciences

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present preliminary obtained with a new spectrometer based on the Johann configuration of cylindrically bent crystals, the HIDEX. The aim of this instrument is to provide detailed line shape and shift measurements of transitions originating from high intensity laser/matter interaction, especially when matter is in extreme conditions of temperature and density. The HIDEX provides two new features. First, its alignment procedure has been improved being now based on an accurate motorized rotation stage that provides a robust and fast way to position the main components in the desired geometrical configuration. Second, there is the option to mount a Charge Coupled Device (CCD) as detector, allowing the instrument to be operated in high repetition rate laser facilities where opening the chamber migh be a critical issue. Here, we report about the test of the prototype at PALS kilo-joule laser facility, Prague, that demonstrated the new alignment procedure concept. First results are discussed.

Original languageEnglish
Title of host publicationIFSA 2011 - 7th International Conference on Inertial Fusion Sciences and Applications
DOIs
Publication statusPublished - 1 Dec 2013
Event7th International Conference on Inertial Fusion Sciences and Applications, IFSA 2011 - Bordeaux, France
Duration: 12 Sept 201116 Sept 2011

Publication series

NameEPJ Web of Conferences
Volume59
ISSN (Print)2101-6275
ISSN (Electronic)2100-014X

Conference

Conference7th International Conference on Inertial Fusion Sciences and Applications, IFSA 2011
Country/TerritoryFrance
CityBordeaux
Period12/09/1116/09/11

Fingerprint

Dive into the research topics of 'HIDEX: A new high resolution x-ray spectrometer for detailed line profile measurements'. Together they form a unique fingerprint.

Cite this