Abstract
The full characterization of a time resolved x-ray spectrometer is presented. It is based on the coupling of a conical crystal with a subpicosecond x-ray streak camera. The detector is designed to operate in accumulation mode at high repetition rate (up to 1 kHz) allowing signal to noise ratio as high as 104: 1. Optical switches have been used to limit the jitter induced in the subpicosecond range, demonstrating the very long term stability (a few hours) of the entire device. The data analysis have been developed to get the spectral and temporal resolution of an ultrashort laser-plasma-based x-ray source.
| Original language | English |
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| Article number | 043503 |
| Journal | Review of Scientific Instruments |
| Volume | 78 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 8 May 2007 |