High resolution spectral characterization of Betatron X-ray radiation

  • Félicie Albert
  • , Kim Ta Phuoc
  • , Rahul Shah
  • , Romuald Fitour
  • , Frédéric Burgy
  • , Amar Tafzi
  • , Denis Douillet
  • , Thierry Lefrou
  • , Antoine Rousse

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present the first detailed spectral measurement of 1-3 keV Betatron X-ray radiation with two high resolution crystal spectrometers. Electron trajectories in the laser produced plasma can be determined with this measurement.

Original languageEnglish
Title of host publication2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS
DOIs
Publication statusPublished - 17 Sept 2008
EventConference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS 2008 - San Jose, CA, United States
Duration: 4 May 20089 May 2008

Publication series

Name2008 Conference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS

Conference

ConferenceConference on Quantum Electronics and Laser Science Conference on Lasers and Electro-Optics, CLEO/QELS 2008
Country/TerritoryUnited States
CitySan Jose, CA
Period4/05/089/05/08

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