High resolution spectral characterization of Betatron X-ray radiation

  • Félicie Albert
  • , Kim Ta Phuoc
  • , Rahul Shah
  • , Romuald Fitour
  • , Frédéric Burgy
  • , Amar Tafzi
  • , Denis Douillet
  • , Thierry Lefrou
  • , Antoine Rousse

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We present the first detailed spectral measurement of 1-3 keV Betatron X-ray radiation with two high resolution crystal spectrometers. Electron trajectories in the laser produced plasma can be determined with this measurement.

Original languageEnglish
Title of host publicationConference on Lasers and Electro-Optics, CLEO 2008
PublisherOptical Society of America
ISBN (Print)9781557528599
Publication statusPublished - 1 Jan 2008
EventConference on Lasers and Electro-Optics, CLEO 2008 - San Jose, CA, United States
Duration: 4 May 20089 May 2008

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Conference

ConferenceConference on Lasers and Electro-Optics, CLEO 2008
Country/TerritoryUnited States
CitySan Jose, CA
Period4/05/089/05/08

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