Identifying defects in an unknown background using differential measurements

Lorenzo Audibert, Alexandre Girard, Houssem Haddar

Research output: Contribution to journalArticlepeer-review

Abstract

We present a new qualitative imaging method capable of selecting defects in complex and unknown background from differential measurements of farfield operators: i.e. far measurements of scattered waves in the cases with and without defects. Indeed, the main diffculty is that the background physical properties are unknown. Our approach is based on a new exact characterization of a scatterer domain in terms of the farfield operator range and the link with solutions to so-called interior transmission problems. We present the theoretical foundations of the method and some validating numerical experiments in a two dimensional setting.

Original languageEnglish
Pages (from-to)625-643
Number of pages19
JournalInverse Problems and Imaging
Volume9
Issue number3
DOIs
Publication statusPublished - 1 Aug 2015

Keywords

  • Differential measurements
  • Factorization method
  • Inverse scattering problems
  • Linear sampling method
  • Qualitative methods

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