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Imaging and quality assessment of high-harmonic focal spots

  • C. Valentin
  • , D. Douillet
  • , S. Kazamias
  • , Th Lefrou
  • , G. Grillon
  • , F. Augé
  • , G. Mullot
  • , Ph Balcou
  • , P. Mercére
  • , Ph Zeitoun

Research output: Contribution to journalArticlepeer-review

Abstract

We present a direct method of studying the focusability of an intense, short-pulse extreme-ultraviolet (XUV) beam obtained by high-harmonic generation. We perform near-field imaging of the focal spot of five high-harmonic orders strongly focused by a broadband toroidal mirror. To visualize the focal spot directly, we image the fluorescence induced by an XUV beam on a cerium-doped YAG crystal on a visible CCD camera. We can thus measure the harmonic spot size on a single image, together with the Strehl ratio, to evaluate the quality of focusing. Such techniques should become instrumental in optimizing the focusing conditions and reaching intensities required for exploring attosecond nonlinear optics in the XUV range.

Original languageEnglish
Pages (from-to)1049-1051
Number of pages3
JournalOptics Letters
Volume28
Issue number12
DOIs
Publication statusPublished - 15 Jun 2003

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