Imaging defects in an elastic waveguide using time-dependent surface data

We are interested here in applying the Linear Sampling Method to the context of Non Destructive Testing for waveguides. Specifically the Linear Sampling Method [1] in its modal form [2] is adapted to image defects in an elastic waveguide from realistic scattering data, that is data coming from sources and receivers on the surface of the waveguide in the time domain, as it has already been done in the acoustic case [16]. The obtained method is applied to artificial data and to experimental data in the special case of back-scattering.