Imaging junctions of waveguides

Laurent Bourgeois; Jean François Fritsch; Arnaud Recoquillay

doi:10.3934/ipi.2020065

Imaging junctions of waveguides

Laurent Bourgeois, Jean François Fritsch, Arnaud Recoquillay

Research output: Contribution to journal › Article › peer-review

Abstract

In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.

Original language	English
Pages (from-to)	285-314
Number of pages	30
Journal	Inverse Problems and Imaging
Volume	15
Issue number	2
DOIs	https://doi.org/10.3934/ipi.2020065
Publication status	Published - 1 Jan 2021

Keywords

Dirichlet-to-Neumann operator
Fundamental solution
Inverse scattering
Junction
Linear sampling method
Waveguide

Access to Document

10.3934/ipi.2020065

Cite this

@article{67aa576405324b3e8c020159f0958390,

title = "Imaging junctions of waveguides",

abstract = "In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.",

keywords = "Dirichlet-to-Neumann operator, Fundamental solution, Inverse scattering, Junction, Linear sampling method, Waveguide",

author = "Laurent Bourgeois and Fritsch, \{Jean Fran{\c c}ois\} and Arnaud Recoquillay",

year = "2021",

month = jan,

day = "1",

doi = "10.3934/ipi.2020065",

language = "English",

volume = "15",

pages = "285--314",

journal = "Inverse Problems and Imaging",

issn = "1930-8337",

number = "2",

}

TY - JOUR

T1 - Imaging junctions of waveguides

AU - Bourgeois, Laurent

AU - Fritsch, Jean François

AU - Recoquillay, Arnaud

PY - 2021/1/1

Y1 - 2021/1/1

N2 - In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.

AB - In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.

KW - Dirichlet-to-Neumann operator

KW - Fundamental solution

KW - Inverse scattering

KW - Junction

KW - Linear sampling method

KW - Waveguide

U2 - 10.3934/ipi.2020065

DO - 10.3934/ipi.2020065

M3 - Article

AN - SCOPUS:85103045470

SN - 1930-8337

VL - 15

SP - 285

EP - 314

JO - Inverse Problems and Imaging

JF - Inverse Problems and Imaging

IS - 2

ER -

Imaging junctions of waveguides

Abstract

Keywords

Access to Document

Fingerprint

Cite this