Impact evaluation of logic blocks configuration on FPGA's soft error rate estimation

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The Soft Error Rate (SER) of an electronic system depends on its sensitivity to the transient faults on its internal elements. Therefore, the SER is commonly estimated by injecting faults into these elements, using a uniform fault distribution. Although this approach can adequately support a feasibility or a compliance analysis, a more accurate estimation would offer a suitable parameter for classifying and choosing an optimum system design. The SER estimation accuracy could be improved by using the fault probability of each internal element. This approach would be especially interesting for FPGAs, which have Configurable Logic Blocks (CLBs) implementing different functions with distinct fault probabilities. In this context, this work evaluates how the CLB configuration impacts the SER estimation of two circuits implemented on a ProASIC3E FPGA. A difference of 14% is observed between the SER estimation considering the CLBs individual fault probabilities and the SER estimation with uniformly distributed faults. Additionally, the SER considering the CLB configuration is closer to the estimation obtained from a transistor-level fault injection. This result shows the influence of the CLB configuration on the SER estimation and indicates that a more accurate value can be obtained by taking this factor into account.

Original languageEnglish
Title of host publication2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages277-280
Number of pages4
ISBN (Electronic)9781509061136
DOIs
Publication statusPublished - 1 Jan 2016
Event23rd IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016 - Monte Carlo, Monaco
Duration: 11 Dec 201614 Dec 2016

Publication series

Name2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016

Conference

Conference23rd IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016
Country/TerritoryMonaco
CityMonte Carlo
Period11/12/1614/12/16

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