Skip to main navigation Skip to search Skip to main content

Impact of Intentional Electromagnetic Interference on Pure Combinational Logic

  • Institut Polytechnique de Paris

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Electromagnetic fault injection is a growing topic when it is applied to jeopardize the security of integrated circuit. Indeed, if the main part of the process will focus on the hardware efficiency of the near-field probes, tweaking properties of the electromagnetic disturbance can also lead to the success of the attack. In this paper, we are presenting characterization results of intentional electromagnetic interference by measuring its impact within the target, and more precisely on the propagation delay of a combinational logic path. The evaluation of the impact shows that the electromagnetic coupling between the probe and the integrated circuit strongly depends on the characterized properties.

Original languageEnglish
Title of host publicationEMC Europe 2019 - 2019 International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages398-403
Number of pages6
ISBN (Electronic)9781728105932
DOIs
Publication statusPublished - 1 Sept 2019
Event2019 International Symposium on Electromagnetic Compatibility, EMC Europe 2019 - Barcelona, Spain
Duration: 2 Sept 20196 Sept 2019

Publication series

NameEMC Europe 2019 - 2019 International Symposium on Electromagnetic Compatibility

Conference

Conference2019 International Symposium on Electromagnetic Compatibility, EMC Europe 2019
Country/TerritorySpain
CityBarcelona
Period2/09/196/09/19

Keywords

  • Side-channel attacks
  • field programmable gate array
  • immunity testing
  • probes

Fingerprint

Dive into the research topics of 'Impact of Intentional Electromagnetic Interference on Pure Combinational Logic'. Together they form a unique fingerprint.

Cite this