Impact of the gain model on the stability assessment in semiconductor DFB lasers

Ivan Aldaya, Gabriel Campuzano, Christophe Gosset, Cheng Wang, Frédéric Grillot, Gerardo Castañón

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Optical injection locking of semiconductor lasers has attracted significant attention due to its applications in laser analysis, modulation characteristic enhancement, and nonlinear dynamics. In many cases, the analysis of the optically injected laser is done by simulation, requiring an accurate laser model and, therefore, an adequate modeling of the gain compression at high photon densities. We use the Kobayashi-Lang rate equations to numerically compare the stable locking range considering four different gain models. Results reveal that at low bias currents, gain compression is significant only under weak injection regime. In contrast, for higher bias current, gain compression must be considered both in weak and strong injection regimes.

Original languageEnglish
Title of host publicationPhysics and Simulation of Optoelectronic Devices XXII
PublisherSPIE
ISBN (Print)9780819498939
DOIs
Publication statusPublished - 1 Jan 2014
Externally publishedYes
EventPhysics and Simulation of Optoelectronic Devices XXII - San Francisco, CA, United States
Duration: 3 Feb 20146 Feb 2014

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8980
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferencePhysics and Simulation of Optoelectronic Devices XXII
Country/TerritoryUnited States
CitySan Francisco, CA
Period3/02/146/02/14

Keywords

  • Gain model
  • Laser simulation.
  • Optical injection locking

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