Abstract
The improvement of silicon surface passivation was discussed. The use of a hydrogen plasma treatment, just before hydrogenated amorphous silicon carbide deposition, was studied. The dependence lifetime of crystalline silicon was measured through a quasi-steady photoconductance technique. It was found that the the hydrogen plasma treatment improved surface passivation compared to HF dip.
| Original language | English |
|---|---|
| Pages (from-to) | 1474-1476 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 84 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 1 Mar 2004 |