In-plane silicon nanowires for field effect transistor application

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Silicon nanowires (SiNW) are important building blocks for a new generation of transistor and sensor applications. Integration and up-scaling of these functionalities rely on a critical ability to position and assemble these nanoscale 1D channels over large areas. We have proposed and demonstrated an in-plane solid-liquid-solid (IPSLS) growth mode of SiNWs, which enables unprecedented morphology control of the in-plane SiNWs and precise deployment of large-scale SiNW arrays. Notably, all the fabrication process can be accomplished in a CMOS compatible all-in-situ plasma deposition environment. We will present here the recent progress in this field and address particularly their related aspects for field effect transistor application.

Original languageEnglish
Title of host publication2011 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors, ULSIC vs. TFT
PublisherElectrochemical Society Inc.
Pages147-154
Number of pages8
Edition1
ISBN (Electronic)9781607682516
ISBN (Print)9781607682523
DOIs
Publication statusPublished - 1 Jan 2011
Event3rd International Conference on Semiconductor Technology for Ultra Large Integrated Circuits and Thin Film Transistors, ULSIC vs. TFT III - Hong Kong, China
Duration: 27 Jun 20111 Jul 2011

Publication series

NameECS Transactions
Number1
Volume37
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Conference

Conference3rd International Conference on Semiconductor Technology for Ultra Large Integrated Circuits and Thin Film Transistors, ULSIC vs. TFT III
Country/TerritoryChina
CityHong Kong
Period27/06/111/07/11

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