Abstract
In the field of the stability of a-Si:H, the received wisdom is that a high clustered-phase SiH concentration is to be avoided. In this high-intensity illumination study of a-Si:H films grown using different techniques, it is found that the steady-state defect density is proportional to the dilute-phase concentration [SiH]d below ≈ 16%. A model is proposed to quantify the participation of the different H-bonding configurations in the metastability phenomena. It predicts a steady-state defect density proportional to [SiH]d and accurately describes the recently observed changes in the infrared absorption of the various H-bonding configurations during light-soaking.
| Original language | English |
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| Pages (from-to) | 449-452 |
| Number of pages | 4 |
| Journal | Journal of Non-Crystalline Solids |
| Volume | 198-200 |
| Issue number | PART 1 |
| DOIs | |
| Publication status | Published - 1 Jan 1996 |