Abstract
Chemistry of co-evaporated CIGS surfaces submitted to chemical treatments relevant to fabrication steps were investigated by XPS and admittance spectroscopy. A Se XPS signal specific of the CIGS surfaces was identified. Surface states seen by Admittance and surface chemistry are seen to change significantly during the elaboration steps. Consequences for device elaboration are briefly discussed.
| Original language | English |
|---|---|
| Pages (from-to) | H521-H526 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 668 |
| DOIs | |
| Publication status | Published - 1 Jan 2001 |
| Externally published | Yes |