Interface electronic structure in a metal/ferroelectric heterostructure under applied bias

J. E. Rault, G. Agnus, T. Maroutian, V. Pillard, Ph Lecoeur, G. Niu, B. Vilquin, M. G. Silly, A. Bendounan, F. Sirotti, N. Barrett

Research output: Contribution to journalArticlepeer-review

Abstract

The effective barrier height between an electrode and a ferroelectric (FE) depends on both macroscopic electrical properties and microscopic chemical and electronic structure. The behavior of a prototypical electrode/FE/electrode structure, Pt/BaTiO3/Nb-doped SrTiO3, under in-situ bias voltage is investigated using x-ray photoelectron spectroscopy. The full band alignment is measured and is supported by transport measurements. Barrier heights depend on interface chemistry and on the FE polarization. A differential response of the core levels to applied bias as a function of the polarization state is observed, consistent with Callen charge variations near the interface.

Original languageEnglish
Article number155146
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume87
Issue number15
DOIs
Publication statusPublished - 26 Apr 2013
Externally publishedYes

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