Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources

S. Dobosz; H. Stabile; A. Tortora; P. Monot; F. Réau; M. Bougeard; H. Merdji; B. Carré; Ph Martin; D. Joyeux; D. Phalippou; F. Delmotte; J. Gautier; R. Mercier

doi:10.1063/1.3257676

Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources

S. Dobosz
, H. Stabile
, A. Tortora
, P. Monot
, F. Réau
, M. Bougeard
, H. Merdji
, B. Carré
, Ph Martin
, D. Joyeux
, D. Phalippou
, F. Delmotte
, J. Gautier
, R. Mercier

Research output: Contribution to journal › Article › peer-review

Abstract

We report on an innovative two-dimensional imaging extreme ultraviolet (XUV) interferometer operating at 32 nm based on the mutual coherence of two laser high order harmonics (HOH) sources, separately generated in gas. We give the first evidence that the two mutually coherent HOH sources can be produced in two independent spatially separated gas jets, allowing for probing centimeter-sized objects. A magnification factor of 10 leads to a micron resolution associated with a subpicosecond temporal resolution. Single shot interferograms with a fringe visibility better than 30% are routinely produced. As a test of the XUV interferometer, we measure a maximum electronic density of 3× 10²⁰ cm^-3 1.1 ns after the creation of a plasma on aluminum target.

Original language	English
Article number	113102
Journal	Review of Scientific Instruments
Volume	80
Issue number	11
DOIs	https://doi.org/10.1063/1.3257676
Publication status	Published - 16 Dec 2009
Externally published	Yes

Access to Document

10.1063/1.3257676

Cite this

Dobosz, S., Stabile, H., Tortora, A., Monot, P., Réau, F., Bougeard, M., Merdji, H., Carré, B., Martin, P., Joyeux, D., Phalippou, D., Delmotte, F., Gautier, J., & Mercier, R. (2009). Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources. Review of Scientific Instruments, 80(11), Article 113102. https://doi.org/10.1063/1.3257676

@article{a0783510452e4dd08ab2300c531d2b83,

title = "Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources",

abstract = "We report on an innovative two-dimensional imaging extreme ultraviolet (XUV) interferometer operating at 32 nm based on the mutual coherence of two laser high order harmonics (HOH) sources, separately generated in gas. We give the first evidence that the two mutually coherent HOH sources can be produced in two independent spatially separated gas jets, allowing for probing centimeter-sized objects. A magnification factor of 10 leads to a micron resolution associated with a subpicosecond temporal resolution. Single shot interferograms with a fringe visibility better than 30\% are routinely produced. As a test of the XUV interferometer, we measure a maximum electronic density of 3× 1020 cm-3 1.1 ns after the creation of a plasma on aluminum target.",

author = "S. Dobosz and H. Stabile and A. Tortora and P. Monot and F. R{\'e}au and M. Bougeard and H. Merdji and B. Carr{\'e} and Ph Martin and D. Joyeux and D. Phalippou and F. Delmotte and J. Gautier and R. Mercier",

year = "2009",

month = dec,

day = "16",

doi = "10.1063/1.3257676",

language = "English",

volume = "80",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

number = "11",

}

Dobosz, S, Stabile, H, Tortora, A, Monot, P, Réau, F, Bougeard, M, Merdji, H, Carré, B, Martin, P, Joyeux, D, Phalippou, D, Delmotte, F, Gautier, J & Mercier, R 2009, 'Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources', Review of Scientific Instruments, vol. 80, no. 11, 113102. https://doi.org/10.1063/1.3257676

TY - JOUR

T1 - Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources

AU - Dobosz, S.

AU - Stabile, H.

AU - Tortora, A.

AU - Monot, P.

AU - Réau, F.

AU - Bougeard, M.

AU - Merdji, H.

AU - Carré, B.

AU - Martin, Ph

AU - Joyeux, D.

AU - Phalippou, D.

AU - Delmotte, F.

AU - Gautier, J.

AU - Mercier, R.

PY - 2009/12/16

Y1 - 2009/12/16

N2 - We report on an innovative two-dimensional imaging extreme ultraviolet (XUV) interferometer operating at 32 nm based on the mutual coherence of two laser high order harmonics (HOH) sources, separately generated in gas. We give the first evidence that the two mutually coherent HOH sources can be produced in two independent spatially separated gas jets, allowing for probing centimeter-sized objects. A magnification factor of 10 leads to a micron resolution associated with a subpicosecond temporal resolution. Single shot interferograms with a fringe visibility better than 30% are routinely produced. As a test of the XUV interferometer, we measure a maximum electronic density of 3× 1020 cm-3 1.1 ns after the creation of a plasma on aluminum target.

AB - We report on an innovative two-dimensional imaging extreme ultraviolet (XUV) interferometer operating at 32 nm based on the mutual coherence of two laser high order harmonics (HOH) sources, separately generated in gas. We give the first evidence that the two mutually coherent HOH sources can be produced in two independent spatially separated gas jets, allowing for probing centimeter-sized objects. A magnification factor of 10 leads to a micron resolution associated with a subpicosecond temporal resolution. Single shot interferograms with a fringe visibility better than 30% are routinely produced. As a test of the XUV interferometer, we measure a maximum electronic density of 3× 1020 cm-3 1.1 ns after the creation of a plasma on aluminum target.

U2 - 10.1063/1.3257676

DO - 10.1063/1.3257676

M3 - Article

AN - SCOPUS:71749110160

SN - 0034-6748

VL - 80

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 11

M1 - 113102

ER -

Internal frequency conversion extreme ultraviolet interferometer using mutual coherence properties of two high-order-harmonic sources

Abstract

Access to Document

Fingerprint

Cite this