Abstract
A study combining optical absorption, MCDA, ODEPR and PAS in undoped SI GaAs shows that the concentrations of paramagnetic EL2, EL2+, and near bandgap Reverse Contrast absorptions, a paramagnetic GaAs-related defect in trigonal symmetry and the concentrations of As vacancies are correlated.
| Original language | English |
|---|---|
| Pages (from-to) | 195-200 |
| Number of pages | 6 |
| Journal | Materials Science Forum |
| Volume | 196-201 |
| Issue number | pt 1 |
| DOIs | |
| Publication status | Published - 1 Jan 1995 |
| Externally published | Yes |
| Event | Proceedings of the 1995 18th International Conference on Defects in Semiconductors, ICDS-18. Part 1 (of 4) - Sendai, Jpn Duration: 23 Jul 1995 → 28 Jul 1995 |