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Investigation of strong electric-field induced surface phenomena by soft X-UV laser interferometry

  • Ph Zeitoun
  • , F. Albert
  • , P. Jaeglé
  • , D. Joyeux
  • , M. Boussoukaya
  • , A. Carillon
  • , S. Hubert
  • , G. Jamelot
  • , A. Klisnick
  • , D. Phalippou
  • , J. C. Lagron
  • , D. Ros
  • , S. Sebban
  • , A. Zeitoun-Fakiris
  • Université Paris-Saclay
  • Institut Pierre Simon Laplace, CNRS and CEA

Research output: Contribution to journal › Article › peer-review

30 Citations (Scopus)

Abstract

Transient perturbed niobium surface states are observed for the first time during a long continued action of the applied DC-field owing to surface imaging by the means of an X-UV laser interferometry technique.

Original languageEnglish
Pages (from-to)189-191
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume416
Issue number1
DOIs
Publication statusPublished - 11 Oct 1998
Externally publishedYes

Keywords

  • Electric field
  • Interferometry
  • Surface morphology
  • X-ray laser

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