Abstract
Relative measurement of the phase of the surface second-order susceptibility is shown to be easily obtained in a surface second-harmonic generation experiment by inserting a quarter-wave plate on the fundamental and measuring the second-harmonic intensity vs. the fundamental ellipticity. This technique is applied to two samples: an isotropic surface of chiral molecules and a calcite crystal. In both cases, a dephasing between the different susceptibility components is observed.
| Original language | English |
|---|---|
| Pages (from-to) | 321-323 |
| Number of pages | 3 |
| Journal | Applied Physics B: Lasers and Optics |
| Volume | 68 |
| Issue number | 2-3 |
| DOIs | |
| Publication status | Published - 1 Jan 1999 |