Abstract
Research on metal halide perovskites as absorbers for X-ray detection is an attractive subject due to the optimal optoelectronic properties of these materials for high-sensitivity applications. However, the contact degradation and the long-term instability of the current limit the performance of the devices, in close causality with the dual electronic-ionic conductivity of these perovskites. Herein, millimeter-thick methylammonium-lead bromide (MAPbBr3) single and polycrystalline samples are approached by characterizing their long-term dark current and photocurrent under X-ray incidence. It is shown how both the dark current and the sensitivity of the detectors follow similar trends at short-circuit (V = 0 V) after biasing. By performing drift-diffusion numerical simulations, it is revealed how large ionic-related built-in fields not only produce relaxations to equilibrium lasting up to tens of hours but also continue to affect the charge kinetics under homogeneous low photogeneration rates. Furthermore, a method is suggested for estimating the ionic mobility and concentration by analyzing the initial current at short-circuit and the characteristic diffusion times.
| Original language | English |
|---|---|
| Pages (from-to) | 386-393 |
| Number of pages | 8 |
| Journal | ACS Physical Chemistry Au |
| Volume | 3 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 26 Jul 2023 |
Keywords
- X-ray detectors
- ion diffusion
- ion migration
- metal halide perovskites
- sensitivity
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