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Ionization mechanisms in dielectrics irradiated by femtosecond laser pulses

  • V. V. Temnov
  • , K. Sokolowski-Tinten
  • , P. Zhou
  • , B. Rethfeld
  • , V. E. Gruzdev
  • , A. El-Khamawy
  • , D. Von Der Linde
  • University of Duisburg-Essen

Research output: Contribution to journalConference articlepeer-review

Abstract

In order to investigate the ultrafast dynamics of free carriers generated in bulk dielectrics by intense femtosecond laser pulses we have designed a setup for ultrafast time-resolved imaging Mach-Zehnder interferometry. The application of the 2D-Fourier-transform technique allows us to accurately reconstruct the actual laser-induced phase shifts and transmission changes for the probe pulses, which provide the properties of free carriers. Interferometric measurements in high-purity fused silica clearly demonstrate that the dominant ionization mechanism for intensities below 10 TW/cm 2 is multiphoton ionization.

Original languageEnglish
Article number164
Pages (from-to)1119-1126
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume5448
Issue numberPART 2
DOIs
Publication statusPublished - 1 Dec 2004
Externally publishedYes
EventHigh-Power Laser Ablation V - Taos, NM, United States
Duration: 25 Apr 200430 Apr 2004

Keywords

  • Fs-laser-induced ionization of dielectrics
  • Time-resolved interferometry

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