Abstract
In order to investigate the ultrafast dynamics of free carriers generated in bulk dielectrics by intense femtosecond laser pulses we have designed a setup for ultrafast time-resolved imaging Mach-Zehnder interferometry. The application of the 2D-Fourier-transform technique allows us to accurately reconstruct the actual laser-induced phase shifts and transmission changes for the probe pulses, which provide the properties of free carriers. Interferometric measurements in high-purity fused silica clearly demonstrate that the dominant ionization mechanism for intensities below 10 TW/cm 2 is multiphoton ionization.
| Original language | English |
|---|---|
| Article number | 164 |
| Pages (from-to) | 1119-1126 |
| Number of pages | 8 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5448 |
| Issue number | PART 2 |
| DOIs | |
| Publication status | Published - 1 Dec 2004 |
| Externally published | Yes |
| Event | High-Power Laser Ablation V - Taos, NM, United States Duration: 25 Apr 2004 → 30 Apr 2004 |
Keywords
- Fs-laser-induced ionization of dielectrics
- Time-resolved interferometry
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