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Irradiation temperature effects on the induced point defects in Ge-doped optical fibers.

  • A. Alessi
  • , I. Reghioua
  • , S. Girard
  • , S. Agnello
  • , D. Di Francesca
  • , L. Martin-Samos
  • , C. Marcandella
  • , N. Richard
  • , M. Cannas
  • , A. Boukenter
  • , Y. Ouerdane
  • Laboratoire Hubert Curien UMR CNRS 5516
  • University of Palermo
  • CEA/UVSQ/CNRS
  • University of Nova Gorica

Research output: Contribution to journalConference articlepeer-review

Abstract

We present an experimental investigation on the combined effects of temperature and irradiation on Ge-doped optical fibers. Our samples were X-ray (10 keV) irradiated up to 5 kGy with a dose rate of 50 Gy(SiO2)/s changing the irradiation temperature in the range 233-573 K. After irradiation we performed electron paramagnetic resonance (EPR) and confocal microscopy luminescence (CML) measurements. The recorded data prove the generation of different Ge related paramagnetic point defects and of a red emission, different from that of the Ge/Si Non-Bridging Oxygen Hole center. Furthermore, by comparing the behaviour of the EPR signal of the Ge(1) as a function of the irradiation temperature with the one of the red emission we can exclude that this emission is originated by the Ge(1).

Original languageEnglish
Article number012008
JournalIOP Conference Series: Materials Science and Engineering
Volume169
Issue number1
DOIs
Publication statusPublished - 16 Feb 2017
Externally publishedYes
Event2016 International Conference on Defects in Insulating Materials, ICDIM 2016 - Lyon, France
Duration: 10 Jul 201615 Jul 2016

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