Light depolarization effects in tip enhanced Raman spectroscopy of silicon (001) and gallium arsenide (001)

  • P. G. Gucciardi
  • , J. C. Valmalette
  • , M. Lopes
  • , R. Dèturche
  • , M. Lamy De La Chapelle
  • , D. Barchiesi
  • , F. Bonaccorso
  • , C. D'Andrea
  • , M. Chaigneau
  • , G. Picardi
  • , R. Ossikovski

Research output: Contribution to journalArticlepeer-review

Abstract

We report on the effects of light depolarization induced by sharp metallic tips in Tip-Enhanced Raman Spectroscopy (TERS). Experiments on Si(001) and GaAs(001) crystals show that the excitation feld depolarization induces a selective enhancement of specifc Raman modes, depending on their Raman tensor symmetry. A complete polarization analysis of the light backscattered from the tip confrms the TERS fndings. The spatial confnement of the depolarization feld is studied and its dependence on the excitation wavelength and power are explored.

Original languageEnglish
JournalAAPP Atti della Accademia Peloritana dei Pericolanti, Classe di Scienze Fisiche, Matematiche e Naturali
Volume89
Issue numberSUPPL. 1
DOIs
Publication statusPublished - 1 Dec 2011

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