Abstract
We report on the effects of light depolarization induced by sharp metallic tips in Tip-Enhanced Raman Spectroscopy (TERS). Experiments on Si(001) and GaAs(001) crystals show that the excitation feld depolarization induces a selective enhancement of specifc Raman modes, depending on their Raman tensor symmetry. A complete polarization analysis of the light backscattered from the tip confrms the TERS fndings. The spatial confnement of the depolarization feld is studied and its dependence on the excitation wavelength and power are explored.
| Original language | English |
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| Journal | AAPP Atti della Accademia Peloritana dei Pericolanti, Classe di Scienze Fisiche, Matematiche e Naturali |
| Volume | 89 |
| Issue number | SUPPL. 1 |
| DOIs | |
| Publication status | Published - 1 Dec 2011 |