Abstract
An experimental characterization of the grating couplers for sub-micrometer silicon-on-insulator (SOI) waveguides is presented. The grating couplers have been designed, realized, and characterized for the +1 diffraction order at an operating wavelength of 1.31 μm for TE polarization. At the resonant angle, a coupling efficiency higher than 55% has been measured. The angular coupling range and the wavelength tolerance have been evaluated to 3° and 20 nm, respectively. The grating coupler is followed by a taper, and about 50% of the input power at 1.31 μm is coupled into sub-micrometer rib and strip SOI waveguides. The ration between light power decoupled toward the cladding and light power decoupled toward the substrate is about three.
| Original language | English |
|---|---|
| Pages (from-to) | 3810-3815 |
| Number of pages | 6 |
| Journal | Journal of Lightwave Technology |
| Volume | 24 |
| Issue number | 10 |
| DOIs | |
| Publication status | Published - 1 Oct 2006 |
| Externally published | Yes |
Keywords
- Grating coupler
- Optical coupling
- Rib waveguide
- Silicon-on-insulator (SOI)
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