TY - GEN
T1 - Limitations of fault injection attack based on immunity to radiated EM field standards
AU - Sauvage, Laurent
PY - 2013/12/24
Y1 - 2013/12/24
N2 - Fault injection using electromagnetic pulse is a promising technique for extracting secrets from an integrated circuit. Indeed, among other benefits, it does not need a preparation phase, delicate and costly, as attack using a LASER does. In the field of electromagnetic compatibility, a large set of standards describe how to assess the immunity to electromagnetic radiations of a system or an integrated circuit. In this paper, we show the limitations of their usage to carry out fault injection attack.
AB - Fault injection using electromagnetic pulse is a promising technique for extracting secrets from an integrated circuit. Indeed, among other benefits, it does not need a preparation phase, delicate and costly, as attack using a LASER does. In the field of electromagnetic compatibility, a large set of standards describe how to assess the immunity to electromagnetic radiations of a system or an integrated circuit. In this paper, we show the limitations of their usage to carry out fault injection attack.
M3 - Conference contribution
AN - SCOPUS:84890744966
SN - 9781467349796
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 415
EP - 419
BT - Proceedings of the 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013
T2 - 2013 International Symposium on Electromagnetic Compatibility, EMC Europe 2013
Y2 - 2 September 2013 through 6 September 2013
ER -