Abstract
We present a variant of the traditional photoreflectance microscopy. It allows thermal diffusivity measurements on samples as small as a few tens of microns, possibly of mediocre surface quality.
| Original language | English |
|---|---|
| Pages (from-to) | C7-295-297 |
| Journal | Journal De Physique. IV : JP |
| Volume | 4 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - 1 Jan 1994 |
| Event | Proceedings of the 8th International Topical Meeting on Photoacoustic and Photothermal Phenomena - Guadeloupe, Fr Duration: 22 Jan 1994 → 25 Jan 1994 |