Abstract
Through photomodulated infrared and photoluminescence spectroscopies, electronic states of photocarriers in porous silicon have been investigated. The infrared spectrum of photogenerated carriers is drastically affected by their localization. Results are reported for porous silicon left in the HF solution in which it has been fabricated (wet porous silicon), for porous silicon just after immersion from the previous solution (dry porous silicon), or for porous silicon anodically oxidized in a non fluoride electrolyte just after its fabrication, and then taken out from the electrolyte (oxidized porous silicon).
| Original language | English |
|---|---|
| Pages (from-to) | 519-524 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 358 |
| Publication status | Published - 1 Jan 1995 |
| Event | Proceedings of the 1994 MRS Fall Meeting - Boston, MA, USA Duration: 28 Nov 1994 → 30 Nov 1994 |
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