Low Energy Electronic Excitations in the Layered Cuprates Studied by Copper L3 Resonant Inelastic X-Ray Scattering

  • G. Ghiringhelli
  • , N. B. Brookes
  • , E. Annese
  • , H. Berger
  • , C. Dallera
  • , M. Grioni
  • , L. Perfetti
  • , A. Tagliaferri
  • , L. Braicovich

Research output: Contribution to journalArticlepeer-review

Abstract

The measurement of resonant inelastic x-ray scattering (RIXS) in a variety of layered cuprates at the copper (CU) L3 edge was done where rayleigh scattering was negligible because of the very strong absorption resonance. The insulating compounds such as CuO, La2CuO4, and the optimally doped superconductors such as La1.85Sr 0.15CuO4 were used for measurement. Both the dd and charge transfer excitations were present in all the spectra and the reproduction of the dd-excitation peak was done using simple crystal field model. The RIXS at the L3edge was demonstrated because of the resonance strength and 2p spin-orbit splitting.

Original languageEnglish
Article number117406
Pages (from-to)117406-1-117406-4
JournalPhysical Review Letters
Volume92
Issue number11
DOIs
Publication statusPublished - 19 Mar 2004
Externally publishedYes

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